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IRF230 Datasheet, PDF (5/7 Pages) Samsung semiconductor – N-CHANNEL POWER MOSFETS
IRF230, IRF231, IRF232, IRF233
Typical Performance Curves Unless Otherwise Specified (Continued)
10
80µs PULSE TEST
8
6
4
10V
9V
8V
7V
6V
VGS = 5.0V
2
4.0V
0
0
1
2
3
4
5
VDS, DRAIN TO SOURCE VOLTAGE (V)
FIGURE 6. SATURATION CHARACTERISTICS
10
VDS > ID(ON) x rDS(ON)MAX
80µs PULSE TEST
8
6
125oC
4
25oC
-55oC
2
0
0
1
2
3
4
5
6
7
VGS, GATE TO SOURCE VOLTAGE (V)
FIGURE 7. TRANSFER CHARACTERISTICS
0.8
80µs PULSE TEST
VGS = 10V
0.6
2.2
ID = 3.5A
VGS = 10V
1.8
1.4
1.0
VGS = 20V
0.2
0.6
0
0
10
20
30
40
ID, DRAIN CURRENT (A)
NOTE: Heating effect of 2µs pulse is minimal.
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
0.2
-60 -40 -20 0 20 40 60 80 100 120 140
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 9. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
1.25
ID = 250µA
1.15
1.05
2000
1600
1200
VGS = 0V, f = 1MHz
CISS = CGS + CGD
CRSS = CGD
COSS ≈ CDS + CGD
0.95
800
CISS
0.85
0.75
-40
0
40
80
120
160
TJ, JUNCTION TEMPERATURE (oC)
FIGURE 10. NORMALIZED DRAIN TO SOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
400
0
1
COSS
CRSS
10
20
30
40
50
VDS, DRAIN TO SOURCE VOLTAGE (V)
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
5