CD4030BMS Datasheet, PDF (5/7 Pages) Intersil Corporation – CMOS Quad Exclusive-OR Gate

Specifications CD4030BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
Static Burn-In 1
Note 1
OPEN
3, 4, 10, 11
GROUND
1, 2, 5 - 9, 12, 13
VDD
14
9V ± -0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 2
Note 1
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
Dynamic Burn-
-
In Note 1
7
14
3, 4, 10, 11
2, 6, 9, 13
1, 5, 8, 12
Irradiation
Note 2
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
Schematic Diagram
VDD
p
B*
2(5, 9, 12)
n
A*
1(6, 8, 13)
VSS
VDD
p
n
n
p
VSS
*INPUTS PROTECTED
BY CMOS PROTECTION
NETWORK
VDD
p
p
n
p
J
3(4, 10, 11)
n
TRUTH TABLE FOR 1 OF 4
INDENTICAL GATES
A
B
J
0
0
0
1
0
1
0
1
1
1
1
0
1 = High Level
0 = Low Level
VDD ^VSS
VSS
FIGURE 1. 1 OF 4 IDENTICAL GATES
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