X93156 Datasheet, PDF (4/8 Pages) Intersil Corporation – Digitally Controlled Potentiometer

X93156
DC Electrical Specifications Over recommended operating conditions unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
TYP
MIN
(Note 5)
I_CC1
VCC active current (Increment) CS = V_IL, U/D = V_IL or V_IH and INC = 0.4V
50
@ max. t_CYC V_CC=3V
CS = V_IL, U/D = V_IL or V_IH and INC = 0.4V
200
@ max. t_CYC V_CC = 5V
I_CC2
VCC active current (Store)
(EEPROM Store)
CS = V_IH, U/D = V_IL or V_IH and INC = V_IH @
max. t_WR V_CC = 3V
CS = V_IH, U/D = V_IL or V_IH and INC = V_IH @
max. t_WR V_CC = 5V
I_SB
Standby supply current
CS = V_CC - 0.3V, U/D and INC = V_SS or V_CC
- 0.3V V_CC = 3V
CS = V_CC - 0.3V, U/D and INC = V_SS or V_CC
- 0.3V V_CC = 5V
I_LI
CS input leakage current
V_IN = V_CC
I_LI
CS input leakage current
V_CC = 3V, CS = 0
60
100
I_LI
CS input leakage current
V_CC = 5V, CS = 0
120
200
I_LI
INC, U/D input leakage current
V_IN = V_SS to V_CC
V_IH
CS, INC, U/D input HIGH voltage
V_CC x 0.7
V_IL
CS, INC, U/D input LOW voltage
-0.5
C_IN
CS, INC, U/D input capacitance
(Notes 7, 8)
V_CC = 3V, V_IN = V_SS, T_A = 25°C, f = 1MHz
MAX
250
300
600
1400
1
2
±1
150
250
±1
V_CC + 0.5
V_CC x 0.1
10
UNIT
µA
µA
µA
µA
µA
µA
µA
µA
µA
µA
V
V
pF
Endurance and Data Retention
PARAMETER
MIN
UNIT
Minimum endurance
200,000 Data changes per bit
Data retention
100
Years
Test Circuit #1
Test Point
V_H/R_H
Circuit #2 SPICE Macro Model
R_TOTAL
R_H
R_L
C_H
C_W
C_L
10pF
10pF
25pF
AC Conditions of Test
Input pulse levels
Input rise and fall times
Input reference levels
0V to 3V
10ns
1.5V
AC Electrical Specifications Over recommended operating conditions unless otherwise specified.
SYMBOL
PARAMETER
MIN
TYP
t_Cl
CS to INC setup
100
t_lD
INC HIGH to U/D change
100
t_DI
U/D to INC setup
100
t_lL
INC LOW period
1
t_lH
INC HIGH period
1
t_lC
INC Inactive to CS inactive
1
t_CPH
CS Deselect time (NO STORE)
250
4
MAX
UNIT
ns
ns
ns
µs
µs
µs
ns
FN8182.2
September 16, 2005