HCS125MS Datasheet, PDF (4/9 Pages) Intersil Corporation – Radiation Hardened Quad Buffer, Three-State

Specifications HCS125MS
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
Output Voltage High
Output Voltage Low
Input Leakage Current
Three-State Output
Leakage Current
Noise Immunity
Functional Test
Propagation Delay
Input to Y
Enable Delay
OE to Y
Disable Delay
OE to Y
SYMBOL
(NOTE 1)
CONDITIONS
VOH
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOH = -50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOH = -50µA
VOL
VCC = 5.5V, VIH = 3.85V,
VIL = 1.65V, IOL = 50µA
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, IOL = 50µA
IIN
VCC = 5.5V, VIN = VCC or GND
IOZ
VCC = 5.5V, Force Voltage
= 0V or VCC
FN
VCC = 4.5V, VIH = 3.15V,
VIL = 1.35V, (Note 2)
TPHL
TPLH
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
TPZL
TPZH
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
TPLZ
TPHZ
VCC = 4.5V, VIH = 4.5V,
VIL = 0V
TEMPERATURE
+25^oC
+25^oC
+25^oC
200K RAD
LIMITS
MIN MAX UNITS
VCC
-
V
-0.1
VCC
-
V
-0.1
-
0.1
V
+25^oC
-
0.1
V
+25^oC
+25^oC
-
±5
µA
-
±50
µA
+25^oC
-
-
V
+25^oC
2
25
ns
+25^oC
2
30
ns
+25^oC
2
30
ns
NOTES:
1. All voltages referenced to device GND.
2. For functional tests, VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
+12µA
IOL/IOH
5
−15% of 0 Hour
IOZ
5
±200nA
Spec Number 518831
126