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HI1172_00 Datasheet, PDF (3/7 Pages) Intersil Corporation – 6-Bit, 20MSPS, Video A/D Converter (CMOS)
HI1172
Absolute Maximum Ratings TA = 25oC
Supply Voltage (VDD). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7V
Reference Voltage (VRT, VRB). . . . . . . . . . . . . . . . . . . . VDD to VSS
Analog Input Voltage (VIN). . . . . . . . . . . . . . . . . . . . . . . VDD to VSS
Digital Input Voltage (CLK). . . . . . . . . . . . . . . . . . . . . . . VDD to VSS
Digital Output Voltage (VOH, VOL). . . . . . . . . . . . . . . . . VDD to VSS
Operating Conditions
Supply Voltage Range, AVDD, AVSS . . . . . . . . . . . . 4.75V to 5.25V
Reference Voltage, DVDD, DVSS
VRT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.9V to 5V
VRB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 4.1V
VRT - VRB. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.9V to AVDD
Analog Input Voltage (VIN). . . . . . . . . . . . . . . . . . . . . . . VRB to VRT
Clock Pulse Width
tPW1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25ns (Min)
tPW0 . . . . . . . . . .
Temperature Range
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. . . 25ns
-20oC to
(Min)
75oC
Thermal Information
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
120
Maximum Junction Temperature (Plastic Package) . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications VDD = +5V, VRB = 1V, VRT = 2V, TA = 25oC
PARAMETER
SYMBOL
TEST CONDITIONS
Conversion Speed, fC
Integral Non-Linearity
Differential Non-Linearity
Supply Current
fC
VIN = 1V to 2V
fIN = 1kHz Ramp
EL
fC = 20MSPS
VIN = 1V to 2V
ED
fC = 20MSPS
VIN = 1V to 2V
IDD
fC = 20MSPS
NTSC Ramp Wave Input
Reference Pin Current
Analog Input (-1dB)
IREF
BW
Analog Input Capacitance
Reference Resistance (VRT to VRB)
Offset Voltage
Digital Input Voltage
Digital Input Current
Digital Output Current
Output Data Delay
Differential Gain Error
CIN
RREF
EOT
EOB
VIH
VIL
IIH
IIL
IOH
IOL
TDL
DG
VIN = 1.5V + 0.07VRMS
VDD = Max
VIH = VDD
VIL = 0V
VDD = Min
VOH = VDD = 0.5V
VOL = 0.4V
With TTL 1 Gate and 10pF Load
NTSC 40 IRE Mod
Differential Phase Error
Aperture Jitter
Sampling Delay
DP
Ramp, fC = 14.3MSPS
tAJ
tSD
MIN
TYP
MAX UNITS
0.5
-
20
MSPS
-
±0.3
±0.5
LSB
-
±0.3
±0.5
LSB
-
7
12
mA
3
4
5.7
mA
-
18
-
MHz
-
4
-
pF
175
250
325
Ω
0
-20
-40
mV
15
35
55
mV
4.0
-
-
V
-
-
1.0
V
-
-
5
µA
-
-
5
µA
-1.1
-
-
mA
3.7
-
-
mA
-
18
30
ns
-
1.0
-
%
-
1.0
-
deg
-
40
-
ps
-
4
-
ns
3