X9408_09 Datasheet, PDF (12/20 Pages) Intersil Corporation – Quad Digitally Controlled (XDCP™) Potentiometers

X9408
DC Electrical Specifications (Over recommended operating conditions unless otherwise stated.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 6)
TYP
MAX
(Note 4) (Note 6)
I_CC1
I_CC2
I_SB
I_LI
I_LO
V_IH
V_IL
V_OL
V_CC supply current (nonvolatile write)
V_CC supply current (move wiper, write,
read)
V_CC current (standby)
Input leakage current
Output leakage current
Input HIGH voltage
Input LOW voltage
Output LOW voltage
f_SCL = 400kHz, SDA = Open,
Other Inputs = V_SS
f_SCL = 400kHz, SDA = Open,
Other Inputs = V_SS
SCL = SDA = V_CC, Addr. = V_SS
I_OL = 3mA
V_CC x 0.7
–0.5
5
250
3
10
10
V_CC +0.5
V_CC x 0.1
0.4
UNIT
mA
µA
µA
µA
µA
V
V
V
NOTES:
1. Absolute linearity is utilized to determine actual wiper voltage versus expected voltage as determined by wiper position when used as a
potentiometer.
2. Relative linearity is utilized to determine the actual change in voltage between two successive tap positions when used as a potentiometer. It is
a measure of the error in step size.
3. MI = RTOT/63 or [V(V_H/R_H) - V(V_L/R_L)]/63, single pot
ENDURANCE AND DATA RETENTION
PARAMETER
Minimum endurance
Data retention
MIN
100,000
100
UNIT
Data changes per bit per register
years
CAPACITANCE
SYMBOL
C_I/O (Note 4)
C_IN (Note 4)
TEST
Input/output capacitance (SDA)
Input capacitance (A0, A1, A2, A3, and SCL)
TEST CONDITION
V_I/O = 0V
V_IN = 0V
TYP
(Note 4)
8
6
UNIT
pF
pF
POWER-UP TIMING
SYMBOL
t_PUR (Note 5)
t_PUW (Note 5)
t_RV_CC (Note 6)
PARAMETER
Power-up to initiation of read operation
Power-up to initiation of write operation
V_CC Power-up Ramp
MIN
(Note 6)
0.2
MAX
(Note 6)
1
5
50
UNIT
ms
ms
V/msec
NOTES:
4. Limits should be considered typical and are not production tested.
5. t_PUR and t_PUW are the delays required from the time the third (last) power supply (V_CC, V+ or V-) is stable until the specific
instruction can be issued
6. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.
12
FN8191.4
January 15, 2009