ISL71090SEH25 Datasheet, PDF (1/10 Pages) Intersil Corporation – Radiation Hardened Ultra Low Noise, Precision Voltage Reference

Radiation Hardened Ultra Low Noise, Precision Voltage
Reference
ISL71090SEH25
The ISL71090SEH25 is an ultra low noise, high DC accuracy
precision voltage reference with a wide input voltage range
from 4V to 30V. The ISL71090SEH25 uses the Intersil
Advanced Bipolar technology to achieve sub 2µV_P-P 0.1Hz
noise with an accuracy over temperature and radiation of
0.15%.
The ISL71090SEH25 offers a 2.5V output voltage with
10ppm/°C temperature coefficient and also provides
excellent line and load regulation. The device is offered in an
8 Ld Flatpack package.
The ISL71090SEH25 is ideal for high-end instrumentation,
data acquisition and applications requiring high DC precision
where low noise performance is critical.
Applications
• RH voltage regulators precision outputs
• Precision voltage sources for data acquisition system for
space applications
• Strain and pressure gauge for space applications
Features
• Reference output voltage . . . . . . . . . . . . . . . . . . .2.5V±0.05%
• Accuracy over temperature and radiation . . . . . . . . . .±0.15%
• Output voltage noise . . . . . . . . . . 2µV_P-P Typ (0.1Hz to 10Hz)
• Supply current . . . . . . . . . . . . . . . . . . . . . . . . . . . . 930µA (Typ)
• Tempco (box method) . . . . . . . . . . . . . . . . . . . 10ppm/°C Max
• Output current capability . . . . . . . . . . . . . . . . . . . . . . . . 20mA
• Line regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8ppm/V
• Load regulation . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.5ppm/mA
• Operating temperature range. . . . . . . . . . . .-55°C to +125°C
• Radiation environment
- High dose rate (50-300rad(Si)/s) . . . . . . . . . . . 100krad(Si)
- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . . 100krad(Si)*
- SET/SEL/SEB . . . . . . . . . . . . . . . . . . . . . . . . 86MeV•cm²/mg
*Product capability established by initial characterization. The
“EH” version is acceptance tested on a wafer by wafer basis to
50krad(Si) at low dose rate
• Electrically screened to SMD 5962-13211
Related Literature
• AN1847, “ISL71090SEH25 Evaluation Board User’s Guide”
• AN1848, “SEE Testing of the ISL71090SEH25”
• AN1849, “Radiation Report of the ISL71090SEH25”
ISL71090SEH25
1
8
2
VIN
0.1µF
3
4
7
VREF
6
5
1µF
C
REFIN DACOUT
VDD
VDD
D12
VEE
VEE
D0
1.1k
NOTE: Select C to minimize
settling time.
BIPOFF
GND
HS-565BRH
FIGURE 1. ISL71090SEH25 TYPICAL APPLICATION DIAGRAM
2.503
2.502
2.501
2.500
2.499
2.498
2.497
-55
2.5V +0.1%
UNIT4
UNIT3
UNIT2
UNIT1
UNIT5
2.5V -0.1%
-5
45
95
145
TEMPERATURE (°C)
FIGURE 2. V_OUT vs TEMPERATURE
June 6, 2013
1
FN8451.0
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
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