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IKW75N60T Datasheet, PDF (7/13 Pages) Infineon Technologies AG – Low Loss DuoPack : IGBT in Trench and Fieldstop technology with soft, fast recovery anti-parallel EmCon HE diode
TrenchStop Series
IKW75N60T
q
*) Eon and Ets include losses
due to diode recovery
12.0mJ
Ets*
*) Eon and Ets include losses
due to diode recovery
8.0m J
E ts*
8.0mJ
4.0mJ
6.0m J
Eon*
4.0m J
Eoff
2.0m J
E on*
E off
0.0mJ
0A 20A 40A 60A 80A 100A 120A 140A
IC, COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, RG = 5Ω,
Dynamic test circuit in Figure E)
0.0m J
0Ω
5Ω
10Ω
15Ω
RG, GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, IC = 75A,
Dynamic test circuit in Figure E)
5.0mJ
*) Eon and Ets include losses
due to diode recovery
4.0mJ
3.0mJ Eoff
2.0mJ
Eon*
1.0mJ
*) Eon and Ets include losses
Ets*
due to diode recovery
8mJ
6mJ
Ets*
4mJ
2mJ
Eon*
E off
0.0mJ
25°C 50°C 75°C 100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE = 400V,
VGE = 0/15V, IC = 75A, RG = 5Ω,
Dynamic test circuit in Figure E)
0mJ
300V 350V 400V 450V 500V 550V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ = 175°C,
VGE = 0/15V, IC = 75A, RG = 5Ω,
Dynamic test circuit in Figure E)
Power Semiconductors
7
Rev. 2.4 May 06