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IGP06N60T Datasheet, PDF (7/12 Pages) Infineon Technologies AG – Low Loss DuoPack : IGBT in TrenchStop and Fieldstop technology
TrenchStop® Series
IGP06N60T
q
0,6 mJ
*) Eon and Ets include losses
due to diode recovery
0,5 mJ
Ets*
0,4 mJ
0,3 mJ
0,2 mJ
0,1 mJ
Eoff
Eon*
0,0 mJ 0A 2A 4A 6A 8A 10A
IC, COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ=175°C,
VCE=400V, VGE=0/15V, RG=23Ω,
Dynamic test circuit in Figure E)
*) Eon and Ets include losses
due to diode recovery
Ets*
0,4 mJ
0,3 mJ
Eon*
0,2 mJ
Eoff
0,1 mJ
0,0 mJ
10Ω
30Ω
55Ω
80Ω
RG, GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ=175°C,
VCE = 400V, VGE = 0/15V, IC = 6A,
Dynamic test circuit in Figure E)
0,4mJ
*) Eon and Ets include losses
due to diode recovery
0,3mJ
Ets*
0,2mJ
E off
0,1mJ
E on*
0,0mJ
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE=400V,
VGE = 0/15V, IC = 6A, RG = 23Ω,
Dynamic test circuit in Figure E)
0 ,5m J
*) Eon and Ets include losses
due to diode recovery
E ts*
0 ,4m J
0 ,3m J
0 ,2m J
0 ,1m J
E off
Eon*
0 ,0m J
200V
300V
400V
500V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ = 175°C,
VGE = 0/15V, IC = 6A, RG = 23Ω,
Dynamic test circuit in Figure E)
Power Semiconductors
7
Rev. 2.1 June 06