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XMC4100 Datasheet, PDF (57/94 Pages) Infineon Technologies AG – Microcontroller Series for Industrial Applications
XMC4100 / XMC4200
XMC4000 Family
3.2.7 Die Temperature Sensor
Electrical Parameters
The Die Temperature Sensor (DTS) measures the junction temperature TJ.
Note: These parameters are not subject to production test, but verified by design and/or
characterization.
Table 34 Die Temperature Sensor Parameters
Parameter
Symbol
Values
Unit Note /
Min. Typ. Max.
Test Condition
Temperature sensor range TSR SR -40 − 150 °C
Linearity Error
ΔTLE CC −
±1 −
°C
(to the below defined formula)
Offset Error
ΔTOE CC −
±6 −
°C
Measurement time
tM CC −
− 100 μs
Start-up time after reset
inactive
tTSST SR −
− 10 μs
1) At VDDP_max = 3.63 V the typical offset error increases by an additional ΔTOE = ±1 °C.
per ΔTJ ≤ 30 °C
ΔTOE = TJ - TDTS
VDDP ≤ 3.3 V1)
The following formula calculates the temperature measured by the DTS in [oC] from the
RESULT bit field of the DTSSTAT register.
Temperature TDTS = (RESULT - 605) / 2.05 [°C]
This formula and the values defined in Table 34 apply with the following calibration
values:
• DTSCON.BGTRIM = 8H
• DTSCON.REFTRIM = 4H
Data Sheet
57
V1.3, 2015-10
Subject to Agreement on the Use of Product Information