IL4145A_16 Datasheet, PDF (1/7 Pages) IK Semicon Co., Ltd – Low Power Ground Fault Interrupter

TECHNICAL DATA
Low Power Ground Fault Interrupter
IL4145A
The IL4145AN is a low power controller for AC outlet ground fault
interrupters. These devices detect hazardous grounding conditions, such as
equipment (connected to opposite phases of the AC line) in contact with a
pool of water and open circuits the line before a harmful or lethal shock
occurs.
Contained internally are a 26V zener shunt regulator, an op amp, and an SCR
driver. With the addition of two sense transformers, a bridge rectifier, an
SCR, a relay, and a few additional components, the IL4145AN will detect
and protect against both hot wire to ground and neutral wire to ground faults.
The simple layout and conventional design ensure ease of application and
long-term reliability.
 No potentiometer required
 Direct interface to SCR
 Supply voltage derived from AC line – 26V shunt
 Adjustable sensitivity
 Grounded neutral fault detection
 Meets U.L. 943 standards
 450 μA quiescent current
 Ideal for 120 V or 220 V systems
ORDERING INFORMATION
IL4145AN DIP
IL4145AD SOP
T_A = -35 to 85 C for all packages.
BLOCK DIAGRAM
V_FB
+Input
V_REF
(+13V)
Ground
+
R1
10K
R2
10K
6.5 V 6.5 V
+
6.5 V 6.5 V
+
R3
4.7K
Op Amp Output
+V_S
(+26V)
SCR Trigger
PIN ASSIGNMENT
V_FB 1
+Input 2
V_REF 3
GND 4
8 NC
7 Op Amp Output
6 +V_S
5 SCR Trigger
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
I_CC
Supply Current
P_D
Internal Power Dissipation
Tstg Storage Temperature Range
18
mA
500
mW
-65 to +150
°C
Topr Operating Temperature Range
-35 to +85
°C
T_J
Junction Temperature
125
°C
T_L
Lead Temperature
125
°C
P_D
T_A< 50°C
For T_A> 50°C Derate at
450
mW
6
mW/°C
* Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device.
These are stress ratings only and functional operation of the device at these or any other conditions beyond those
indicated under “recommended operating conditions” is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
January, 2011, rev.01