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| MPC9446AC Datasheet, PDF (3/12 Pages) Integrated Device Technology – 3.3V and 2.5V, LVCMOS Clock Fanout Buffer | |||
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MPC9446 Data Sheet
3.3V AND 2.5V LVCMOS CLOCK FANOUT BUFFER
Table 1. Pin Configuration
Pin
CCLK0,1
FSELA, FSELB, FSELC
MR/OE
GND
VCCA, VCCB(1), VCCC
VCC
QA0 â QA2
QB0 â QB2
QC0 â QC3
I/O
Input
Input
Input
Output
Output
Output
Type
LVCMOS
LVCMOS
LVCMOS
Supply
Supply
Supply
LVCMOS
LVCMOS
LVCMOS
Function
LVCMOS clock inputs
Output bank divide select input
Internal reset and output (high impedance) control
Negative voltage supply (GND)
Positive voltage supply for output banks
Positive voltage supply for core (VCC)
Bank A outputs
Bank B outputs
Bank C outputs
1. VCCB is internally connected to VCC.
Table 2. Supported Single and Dual Supply Configurations
Supply Voltage Configuration
3.3 V
Mixed Voltage Supply
2.5 V
VCC(1)
3.3 V
3.3 V
2.5 V
VCCA(2)
3.3 V
3.3 V or 2.5 V
2.5 V
VCCB(3)
3.3 V
3.3 V
2.5 V
VCCC(4)
3.3 V
3.3 V or 2.5 V
2.5 V
GND
0V
0V
0V
1. VCC is the positive power supply of the device core and input circuitry. VCC voltage defines the input threshold and levels.
2. VCCA is the positive power supply of the bank A outputs. VCCA voltage defines bank A output levels.
3. VCCB is the positive power supply of the bank B outputs. VCCB voltage defines bank B output levels. VCCB is internally connected to VCC.
4. VCCC is the positive power supply of the bank C outputs. VCCC voltage defines bank C output levels.
Table 3. Function Table (Controls)
Control
CCLK_SEL
FSELA
FSELB
FSELC
MR/OE
Default
0
0
0
0
0
0
CCLK0
fQA0:2 = fREF
fQB0:2 = fREF
fQC0:3 = fREF
Outputs enabled
1
CCLK1
fQA0:2 = fREF ï¸ 2
fQB0:2 = fREF ï¸ 2
fQC0:3 = fREF ï¸ 2
Internal reset outputs disabled (tristate)
Table 4. Absolute Maximum Ratings(1)
Symbol
Characteristics
Min
Max
Unit
Condition
VCC
VIN
VOUT
IIN
IOUT
TS
Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Current
DC Output Current
Storage Temperature
â0.3
â0.3
â0.3
â65
3.6
V
VCC+0.3
V
VCC+0.3
V
ï±20
mA
ï±50
mA
125
ï°C
1. Absolute maximum continuous ratings are those maximum values beyond which damage to the device may occur. Exposure to these
conditions or conditions beyond those indicated may adversely affect device reliability. Functional operation under absolute-maximum-rated
conditions is not implied.
MPC9446 REVISION 5 DECEMBER 21, 2012
3
©2012 Integrated Device Technology, Inc.
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