ADC1415S Datasheet, PDF (27/40 Pages) NXP Semiconductors – Single 14-bit ADC; 65 Msps, 80 Msps, 105 Msps or 125 Msps with input buffer; CMOS or LVDS DDR digital outputs

Integrated Device Technology
ADC1415S series
Single 14-bit ADC; input buffer; CMOS or LVDS DDR digital outputs
Table 13. LVDS DDR output register 2 …continued
LVDS_INT_TER[2:0]
Resistor value ()
101
100
110
81
111
60
11.5.3 DAta Valid (DAV) output clock
A data valid output clock signal (DAV) is provided that can be used to capture the data
delivered by the ADC1415S. Detailed timing diagrams for CMOS and LVDS DDR modes
are provided in Figure 4 and Figure 5 respectively.
11.5.4 Out-of-Range (OTR)
An out-of-range signal is provided on pin OTR. The latency of OTR is fourteen clock
cycles. The OTR response can be speeded up by enabling Fast OTR (bit
FASTOTR = logic 1; see Table 29). In this mode, the latency of OTR is reduced to only
four clock cycles. The Fast OTR detection threshold (below full-scale) can be
programmed via bits FASTOTR_DET[2:0].
Table 14. Fast OTR register
FASTOTR_DET[2:0]
000
001
010
011
100
101
110
111
Detection level (dB)
20.56
16.12
11.02
7.82
5.49
3.66
2.14
0.86
11.5.5 Digital offset
By default, the ADC1415S delivers output code that corresponds to the analog input.
However it is possible to add a digital offset to the output code via the SPI (bits
DIG_OFFSET[5:0]; see Table 25).
11.5.6 Test patterns
For test purposes, the ADC1415S can be configured to transmit one of a number of
predefined test patterns (via bits TESTPAT_SEL[2:0]; see Table 26). A custom test pattern
can be defined by the user (TESTPAT_USER; see Table 27 and Table 28) and is selected
when TESTPAT_SEL[2:0] = 101. The selected test pattern is transmitted regardless of the
analog input.
ADC1415S_SER 5
Product data sheet
Rev. 05 — 2 July 2012
© IDT 2012. All rights reserved.
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