8T39S11A Datasheet, PDF(16/37 Page) Integrated Device Technology – Crystal or Differential-to-Differential Clock Fanout Buffer

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8T39S11A Datasheet, PDF (16/37 Pages) Integrated Device Technology – Crystal or Differential-to-Differential Clock Fanout Buffer

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8T39S11A Datasheet

NOTE 3. Measurement taken from differential waveform.

NOTE 4. Measured from the differential input crosspoint to the differential output crosspoint.

NOTE 5. Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential cros-

spoint.

NOTE 6. This parameter is defined in accordance with JEDEC Standard 65.

NOTE 7. Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency

and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at the differential cros-

spoint

NOTE 8. Measurement taken from single-ended waveform.

NOTE 9. Defined as the maximum instantaneous voltage including overshoot.

NOTE 10. Defined as the minimum instantaneous voltage including undershoot.

NOTE 11. Measured at crosspoint where the instantaneous voltage value of the rising edge of Qx equals the falling edge of nQx.

NOTE 12. Refers to the total variation from the lowest crosspoint to the highest, regardless of which edge is crossing. Refers to all cros-

spoint for this measurement.

NOTE 13. Defined as the total variation of all crossing voltages of rising Qx and falling nQx, This is the maximum allowed variance in Vcross

for any particular system.

NOTE 14. Measured from -150mV to +150mV on the differential waveform (Qx minus nQx). The signal must be monotonic through the

measurement region for rise and fall time. The 300mV measurement window is centered on the differential zero crossing.

NOTE 15. Measured at 100MHz.

NOTE 16. Measured for the following frequencies: 25MHz, 100MHz, 125MHz, 156.25MHz, 312.5MHz, 400MHz, and 644.5313MHz.

December 17, 2015

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