English
Language : 

IDT71V2577 Datasheet, PDF (1/23 Pages) Integrated Device Technology – 128K x 36, 256K x 18 3.3V Synchronous SRAMs 2.5V I/O, Flow-Through Outputs Burst Counter, Single Cycle Deselect
128K x 36, 256K x 18
3.3V Synchronous SRAMs
2.5V I/O, Flow-Through Outputs
Burst Counter, Single Cycle Deselect
IDT71V2577
IDT71V2579
Features
x 128K x 36, 256K x 18 memory configurations
x Supports fast access times:
Commercial:
– 7.5ns up to 117MHz clock frequency
Commercial and Industrial:
– 8.0ns up to 100MHz clock frequency
– 8.5ns up to 87MHz clock frequency
x LBO input selects interleaved or linear burst mode
x Self-timed write cycle with global write control (GW), byte write
enable (BWE), and byte writes (BWx)
x 3.3V core power supply
x Power down controlled by ZZ input
x 2.5V I/O
x Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch ball
grid array (fBGA)
Description
The IDT71V2577/79 are high-speed SRAMs organized as
128K x 36/256K x 18. The IDT71V2577/79 SRAMs contain write, data,
address and control registers. There are no registers in the data output
path (flow-through architecture). Internal logic allows the SRAM to
generate a self-timed write based upon a decision which can be left until
the end of the write cycle.
The burst mode feature offers the highest level of performance to the
system designer, as the IDT71V2577/79 can provide four cycles of data
for a single address presented to the SRAM. An internal burst address
counter accepts the first cycle address from the processor, initiating the
access sequence. The first cycle of output data will flow-through from the
array after a clock-to-data access time delay from the rising clock edge of
the same cycle. If burst mode operation is selected (ADV=LOW), the
subsequent three cycles of output data will be available to the user on the
next three rising clock edges. The order of these three addresses are
defined by the internal burst counter and the LBO input pin.
The IDT71V2577/79 SRAMs utilize IDT’s latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and a 165 fine pitch ball grid array (fBGA).
Pin Description Summary
A0-A17
Address Inputs
CE
CS0, CS1
Chip Enable
Chip Selects
OE
Output Enable
GW
Global Write Enable
BWE
Byte Write Enable
BW1, BW2, BW3, BW4(1)
Individual Byte Write Selects
CLK
Clock
ADV
Burst Address Advance
ADSC
Address Status (Cache Controller)
ADSP
Address Status (Processor)
LBO
Linear / Interleaved Burst Order
ZZ
Sleep Mode
I/O0-I/O31, I/OP1-I/OP4
Data Input / Output
VDD, VDDQ
Core Power, I/O Power
VSS
Ground
NOTE:
1. BW3 and BW4 are not applicable for the IDT71V2579.
1
© 2000 ntegrated Device Technology, Inc.
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
I/O
Supply
Supply
Synchronous
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Synchronous
Synchronous
Synchronous
DC
Asynchronous
Synchronous
N/A
N/A
4877 tbl 01
OCTOBER 2000
DSC-4877/06