ICS8535-11 Datasheet, PDF (5/14 Pages) Integrated Circuit Systems – LOW SKEW, 1-TO-4, CRYSTAL OSCILLATOR/ LVCMOS-TO-3.3V LVPECL FANOUT BUFFER

Integrated
Circuit
Systems, Inc.
TABLE 5. CRYSTAL CHARACTERISTICS
Parameter
Mode of Oscillation
Frequency Tolerance
Frequency Stability
Drive Level
Equivalent Series Resistance (ESR)
Shunt Capacitance
Series Pin Inductance
Operating Temperature Range
Aging
Frequency Range
ICS8535-11
LOW SKEW, 1-TO-4, CRYSTAL OSCILLATOR/
LVCMOS-TO-3.3V LVPECL FANOUT BUFFER
Test Conditions
Per year @ 25°C
Minimum Typical Maximum
Fundamental
-50
50
-100
100
0.1
50
80
7
3
7
0
70
-5
5
14
25
Units
ppm
ppm
mW
Ω
pF
nH
°C
ppm
MHz
TABLE 6. AC CHARACTERISTICS, V_CC=3.3V±5%, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum
f_MAX
t_PD
tsk(o)
Maximum Output Frequency
Propagation Delay; NOTE 1
Output Skew; NOTE 2, 5
IJ 266MHz
266
1.0
2.4
25
35
tsk(pp) Part-to-Part skew; NOTE 3, 5
150
t_R
Output Rise Time
20% to 80% @ 50MHz
300
700
t_F
Output Fall Time
20% to 80% @ 50MHz
300
700
odc
Output Duty Cycle; NOTE 4
48
50
52
oscTOL Crystal Oscillator Tollerance
1000
All parameters measured at 266MHz unless noted otherwise.
The cycle-to-cycle jitter on the input will equal the jitter on the output. The part does not add jitter.
NOTE 1: Measured from the 50% point of the input to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at the output differential cross points.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 4: Measured using CLK input. For XTAL input, refer to Application Note.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
Units
MHz
ns
ps
ps
ps
ps
%
ppm
8535AG-11
www.icst.com/products/hiperclocks.html
5
REV. B JULY 27, 2001