ICS85357-11 Datasheet, PDF (4/12 Pages) Integrated Circuit Systems – 4:1 OR 2:1, CRYSTAL OSCILLATOR-TO-3.3V LVPECL / ECL MULTIPLEXER

Integrated
Circuit
Systems, Inc.
TABLE 5. CRYSTAL CHARACTERISTICS
Parameter
Mode of Oscillation / cut
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Series Pin Inductance
Operating Temperature Range
ICS85357-11
4:1 OR 2:1, CRYSTAL OSCILLATOR-TO-3.3V
LVPECL / ECL MULTIPLEXER
Test Conditions
Minimum Typical Maximum
Fundamental / Parallel Resonant
10
25
50
80
7
3
7
0
70
Units
MHz
Ω
pF
nH
°C
TABLE 6. AC CHARACTERISTICS, V_CC = 3.3V±5%, TA=0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum
f_MAX
Output Frequency Range
10
25
t_PD
Propagation Delay; NOTE 1
IJ 25MHz
1
2
tsk(pp) Part-to-Part Skew; NOTE 2, 4
150
t_R
Output Rise Time
20% to 80%
300
700
t_F
Output Fall Time
20% to 80%
300
700
odc
Output Duty Cycle; NOTE 3, 4
47
53
oscTOL Crystal Oscillator Tolerance; NOTE 3
±20
All parameters measured at 25MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
Measured overdriving the XTAL input.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points. Measured overdriving the XTAL input.
NOTE 3: Measured using C1 = 22pF and C2 = 27pF in parallel with 18pF crystals. Refer to Figure 6 in the
Application Section.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
Units
MHz
ns
ps
ps
ps
%
ppm
85357AG-11
www.icst.com/products/hiperclocks.html
4
REV. A JULY 25, 2001