ICS840-77 Datasheet, PDF (3/9 Pages) Integrated Circuit Systems – 77.76MHZ, LVCMOS/LVTTL OSCILLATOR REPLACEMENT

Integrated
Circuit
Systems, Inc.
PRELIMINARY
ICS840-77
77.76MHZ, LVCMOS/LVTTL
OSCILLATOR REPLACEMENT
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V_DD
4.6V
Inputs, V_I
-0.5V to V_DD + 0.5 V
Outputs, V_O
-0.5V to V_DDO + 0.5V
Package Thermal Impedance, θ_JA
8 Lead TSSOP
101.7°C/W (0 mps)
8 Lead SOIC
112.7°C/W (0 lfpm)
Storage Temperature, T_STG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Func-
tional operation of product at these conditions or any condi-
tions beyond those listed in the DC Characteristics or AC
Characteristics is not implied. Exposure to absolute maxi-
mum rating conditions for extended periods may affect prod-
uct reliability.
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, V_DD = V_DDO = 3.3V±0.3V, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum
V_DD
Power Supply Voltage
3.0
V
Output Supply Voltage
3.0
DDO
I_DD
Power Supply Current
OE = V_DD (output enabled)
I_DDO
Output Supply Current
Typical
3.3
3.3
TBD
TBD
Maximum
3.6
3.6
Units
V
V
mA
TABLE 4B. LVCMOS/LVTTL DC CHARACTERISTICS, V_DD = V_DDO = 3.3V±0.3V, TA = 0°C TO 70°C
Symbol Parameter
Test Conditions
Minimum Typical
V_IH
Input High Voltage
2
V_IL
Input Low Voltage
-0.3
I_IH
Input High Current
V_DD = V_IN = 3.6V
I_IL
Input Low Current
V_DD = 3.6V, V_IN = 0V
-150
V_OH
Output High Voltage; NOTE 1
2.6
V_OL
Output Low Voltage; NOTE 1
NOTE 1: Outputs terminated with 50Ω to V_DDO/2. See Parameter Measurement Information Section,
"3.3V Output Load Test Circuit".
Maximum
V_DD + 0.3
0.8
5
0.5
Units
V
V
µA
µA
V
V
TABLE 5. CRYSTAL CHARACTERISTICS
Parameter
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Drive Level
Test Conditions
Minimum Typical Maximum
Fundamental
19.44
TBD
7
TBD
Units
MHz
Ω
pF
µW
840AG-77
www.icst.com/products/hiperclocks.html
3
REV. A NOVEMBER 7, 2005