IC-TL33 Datasheet, PDF (3/4 Pages) IC-Haus GmbH – Infrared LED

iC-TL33 TO46-2L1
Infrared LED
DIAGRAMS
Rev B1, Page 3/4
THERMAL DERATING CURVE
150
100
50
0%
-10%
-20%
-30%
Degradation of optical output power at 125°C
125°C, 20 mA forward current (mean of 32 devices)
125°C, 50 mA forward current (mean of 32 devices)
0
25
50
75
100
125
AMBIENT TEMPERATURE [°C]
Figure 1: Maximum power dissipation with respect
to temperature
iC-TL33 illumination pattern
Distance LED to sensor:
10 mm
3 mm
1 mm
-3 -2
-1
0
1
2
3
Sensor position [mm]
Figure 2: Illumination pattern depending vs. dis-
tance
-40%
0
500
1000
1500
Burn-In Time [h]
2000
Figure 3: Optical output as a function of time. Mean
value shown of 32 devices each.
LED’s generally display a degradation in their optical
power depending on the profile of the individual appli-
cation, i.e. the forward current, chip temperature and
operating time. Typical behavior is shown in Figure 3,
from which the service life can be inferred. Depending
on the profile of use the light yield can be reduced by
30% to 50% during deployment in an industrial applica-
tion (e.g. 50,000 hours), making an LED power control
necessary. The design and dimensioning of the LED
circuitry is determined by the qualification according to
the application-specific profile of use.
State-of-the-art technology guarantees a minimum
beam power in an as-received condition with a defined
current (25°C). A run-in at an operating point of 20 mA
and a chip temperature of 125°C for 72 hours enables
statements to be made as to the initial degradation dur-
ing an accelerated stress test; it does not, however,
provide any conclusions as to the service life of the
LED.
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