H5TQ4G43MMR Datasheet, PDF (20/73 Pages) Hynix Semiconductor – 4Gb DDR3 SDRAM DDP(2Gbx2)

H5TQ4G43MMR-xxC
H5TQ4G83MMR-xxC
6. AC and DC Output Measurement Levels
6.1 Single Ended AC and DC Output Levels
Table shows the output levels used for measurements of single ended signals.
Symbol
Parameter
VOH(DC) _{DC output high measurement level (for IV curve linearity)}
DDR3-1066,
1333
0.8 x VDDQ
Unit Notes
V
VOM(DC) _{DC output mid measurement level (for IV curve linearity)}
0.5 x VDDQ
V
VOL(DC) _{DC output low measurement level (for IV curve linearity)}
0.2 x VDDQ
V
VOH(AC) _{AC output high measurement level (for output SR)}
VTT + 0.1 x VDDQ
V
1
VOL(AC) _{AC output low measurement level (for output SR)}
VTT - 0.1 x VDDQ
V
1
1. The swing of ‚ 1 x VDDQ is based on approximately 50% of the static single ended output high or low swing with
a driver impedance of 40ʃ and an effective test load of 25ʃ to VTT = VDDQ / 2.
6.1.1 Differential AC and DC Output Levels
Below table shows the output levels used for measurements of differential signals.
Symbol
Parameter
DDR3-1066,
1333
Unit Notes
VOHdiff (AC) _{AC differential output high measurement
level (for output SR)}
+ 0.2 x VDDQ
V
1
VOLdiff (AC) _{AC differential output low measurement level (for output SR)}
- 0.2 x VDDQ
V
1
1. The swing of ‚  x VDDQ is based on approximately 50% of the static differential output high or low swing with
a driver impedance of 40ʃ and an effective test load of 25ʃ to VTT = VDDQ/2 at each of the differential outputs.
6.2 Single Ended Output Slew Rate
With the reference load for timing measurements, output slew rate for falling and rising edges is defined and
measured between VOL(AC) and VOH(AC) for single ended signals as shown in Table and Figure.
Description
Single ended output slew rate for rising edge
Single ended output slew rate for falling edge
Measured
From
To
VOL(AC)
VOH(AC)
VOH(AC)
VOL(AC)
Defined by
VOH(AC)-VOL(AC)
DeltaTRse
VOH(AC)-VOL(AC)
DeltaTFse
Note:
Output slew rate is verified by design and characterization, and may not be subject to production test.
Rev. 0.1 /Aug 2008



































































































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