HCPL-520X Datasheet, PDF (8/12 Pages) Agilent(Hewlett-Packard) – Hermetically Sealed, Low IF, Wide VCC, Logic Gate Optocouplers

8
Typical Characteristics (cont’d.)
All typical values are at T_A = 25°C, V_CC = 5 V, I_F(ON) = 5 mA, unless otherwise specified.
Single Channel Product Only
Parameter
Symbol Typ. Units Test Conditions
Output Enable Time to Logic High
Output Enable Time to Logic Low
Output Disable Time from Logic High
t_PZH
30
ns
t_PZL
30
ns
t_PHZ
45
ns
Output Disable Time from Logic Low
t_PLZ
55
ns
Fig. Notes
8
8
8
8
Dual and Quad Channel Products Only
Input-Input Insulation Leakage Current
I_I-I
0.5
nA ^{RH = 45%, TA = 25°C,}
V_I-I = 500 V, t = 5 s
9
Resistance (Input-Input)
R_I-I
10¹³
Ω
V_I-I = 500 V
9
Capacitance (Input-Input)
C_I-I
1.5
pF f = 1 MH
9
Notes:
1. Peak Forward Input Current pulse width < 50 µs at 1 KHz maximum repetition rate.
2. Each channel of a multichannel device.
3. Duration of output short circuit time not to exceed 10 ms.
4. All devices are considered two-terminal devices: measured between all input leads or terminals shorted together and all output leads
or terminals shorted together.
5. This is a momentary withstand test, not an operating condition.
6. CM is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (V
L
O
< 0.8 V). CM is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic
H
high state (V > 2.0 V).
O
7. t propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.3 V point on the leading edge
PHL
of the output pulse. The t propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.3 V
PLH
point on the trailing edge of the output pulse.
8. Measured between each input pair shorted together and all output connections for that channel shorted together.
9. Measured between adjacent input pairs shorted together for each multichannel device.
10. Zero-bias capacitance measured between the LED anode and cathode.
11. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD, Class H and Class K parts receive 100% testing at 25, 125,
and –55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).
12. Parameters are tested as part of device initial characterization and after design and process changes. Parameters guaranteed to limits
specified for all lots not specifically tested.
Figure 1. Typical Logic Low Output
Voltage vs. Temperature.
Figure 2. Typical Logic High Output
Current vs. Temperature.