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HEDS-1200 Datasheet, PDF (5/8 Pages) Agilent(Hewlett-Packard) – Optical Reflective Sensors
HEDS-1200 Optical System
EMITTER
0.089 mm DIA. JUNCTION
OPTICAL
APERTURE
BAFFLE
SILICON
BAFFLE
HEDS-1300 Optical System
EPOXY
SEAL
EMITTER
0.185 mm DIA. JUNCTION
BAFFLE
EPOXY
SEAL
SENSING
AREA
GLASS
DETECTOR
0.406 mm SQUARE
LENS
SENSING
AREA
GLASS
DETECTOR
0.406 mm SQUARE
LENS
REFLECTOR
REFERENCE
Z
PLANE
REFLECTOR
REFERENCE
Z
PLANE
+ VF 6
IF = 35 mA
LED
4
CASE, SUBSTRATE
DP
IPT
3
DS
2
DP
2
+ VF 6
1
LED
IF = 35 mA
DS
8
IPT
3
4
DS
SUBSTRATE, CASE
nA-METER
nA-METER
IPT = IPR + IPS
IPS : MEASURED IN THE DARK
IPR : WITH Z = 4.27 mm
nA-METER: KEITHLEY MODEL 480
(OR EQUIVALENT)
Figure 1A. HEDS-1200 Photocurrent Test Circuit.
Figure 1B. HEDS-1300 Photocurrent Test Circuit.
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