U2722A Datasheet, PDF (12/15 Pages) Agilent(Hewlett-Packard) – Voltage and current programming and readback

U2722P/U2723P Parametric Measurement Solution
Measure and analyze quickly
and efficiently with all
your essential parametric
measurement tools at your
fingertips
Parametric testing is used across a
variety of application and industries
– from a teaching tool in the educa-
tion sector to manufacturing and
troubleshooting in the semiconductor
industry. Now, you can measure
and analyze quickly and efficiently
in all these areas with the one-stop
Parametric Measurement Solution.
The Parametric Measurement
Solution bundle consists of the
Agilent U2722A/U2723A USB modu-
lar source measurement unit and the
Agilent Parametric Measurement
Manager Pro software, providing you
a basic yet complete parametric mea-
surement test solution that analyzes
the performance of components such
as diodes and transistors without
the need for prior programming
experience. The optional Agilent
U2941A parametric test fixture can
further increase your parametric test
efficiency and usability.
The U2722P/U2723P Parametric
Measurement Solution bundle is only
available in Europe and Asia, exclud-
ing Japan.
Figure 5. Easily configure an I-V characterization test with the
Parametric Measurement Manager Pro software.
Figure 6. Execute the I-V characterization test to view results
instantly.
Figure 7. The test results can also be viewed in tabular format
for quick analysis.
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