81150A Datasheet, PDF (10/28 Pages) Agilent(Hewlett-Packard) – Pulse Function Arbitrary Noise Generator

Pass through pattern for combined
physical and protocol test
up to 10 Mbit/s
The 81150A pattern generator passes the data through to the Device under Test
and adopts it to any kind of stress test (shape and timing change).
Bridge the gap between Protocol and Physical Layer Test – in real time up to 10 Mbit/s
Increase your test efficiency by combining physical layer test with protocol test
Modulation
The 81150A pass-through pattern functionality takes the protocol data via
“mod in” and adopts it to any kind of stress test (shape and timing changes)
Modulation of the pattern signal enables you to emulate real-world conditions.
AM – amplitude of the pattern signal is multiplied by the modulation signal to
emulate level distortions o the data signal e.g. Sinusoidal interference.
FM – frequency of the pattern signal is modulated to emulate SSC on the data
signal.
PM – the phase of the data bits is modulated to emulate jitter on the data signal.
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