N7788B Datasheet, PDF (1/6 Pages) Agilent(Hewlett-Packard) – Optical Component Analyzer

Agilent N7788B/BD
Optical Component
Analyzer
Data Sheet
Figure 1. N7788BD bench-top mainframe with built-in PC
Figure 2. N7788B bench-top mainframe
Introduction
Key Benefits
Agilent Technologies pushes the limits of component
measurements with the N7788B component analyzer.
Its proprietary technology is comparable with the well-
known Jones-Matrix-Eigenanalysis (JME) which is
the standard method for measuring polarization mode
dispersion (PMD) or differential group delay (DGD) of
optical devices.
Compared to the JME, Agilent’s new single scan technology
offers a range of advantages:
A complete set of parameters:
● DGD/PMD
● PDL
● Power/loss
● TE/TM-loss
● Jones matrices
● Mueller matrices
● 2nd-order PMD
(depolarization + PCD)
● Principal states of
polarization (PSPs)
● Highest accuracy in a single sweep:
no averaging over multiple sweeps
required
● High measurement speed: Complete
measurement across C/L-band in less
than 10 seconds (no need to wait for
many averages)
● Robustness against fiber movement/
vibration and drift: Fixing fibers with
sticky tape on the table or even operation
on isolated optical table is not required!
● No limitation on optical path length
of component
● The internal referencing scheme guarantees
reliable and accurate measurements.