H28 Datasheet, PDF (2/11 Pages) –

BLOCK DIAGRAM
Figure 1. H28 block diagram
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Conditions
All Voltages with Respect to Ground
Min
Max
Unit
Supply Voltage
VC C
- 0.3
6.0
V
Voltage Range for All Pins
ESD Rating
- 0.3
VI N + 0.3
V
VE S D
For all pins,
-2
Human Body Model (HBM),
2
kV
ESD Association Standard
Test Method ESD-STM5.1
1998, CE S D = 100 pF,
Rs = 1500 :),
Latchup Current Limit
IL U T
For all pins,
- 100
+ 100
mA
test according to
Micro Analog Systems
specification ESQ0141.
Note 1
Junction Temperature
Storage Temperature
TJ m a x
TS
+ 135
°C
- 55
+125
°C
Stresses beyond those listed may cause permanent damage to the device. The device may not operate under these conditions, but it will not
be destroyed.
Note 1. In latchup testing the supply voltages are connected
due to test current pulses and the abnormally high current
normally to the tested device. Then pulsed test current is feeded
consumption continues after test current pulses are cut off then
to each input separately and device current consumption is
the device has gone to latch up. Current pulse is turned on for 10
observed. If the device current consumption increases suddenly
ms and off for 20 ms.