HI-3182PSX-N_08 Datasheet, PDF (3/7 Pages) Holt Integrated Circuits – ARINC 429 Differential Line Driver

HI-3182PSx-N, HI-3184PSx-N, HI-3185PSx-N
PIN DESCRIPTIONS
SYMBOL
VREF
SYNC
DATA (A)
CA
AOUT
-V
GND
+V
BOUT
CB
DATA (B)
CLOCK
V1
FUNCTION
ANALOG
INPUT
INPUT
INPUT
OUTPUT
POWER
POWER
POWER
OUTPUT
INPUT
INPUT
INPUT
POWER
DESCRIPTION
Ref. voltage used to determine output voltage swing. Pin sources current to allow use of a zener reference.
Synchronizes data inputs
Data input terminal A
Connection for DATA (A) slew-rate capacitor
ARINC output terminal A
-12V to -15V
0.0V
+12V to +15V
ARINC output terminal B
Connection for DATA (B) slew-rate capacitor
Data input terminal B
Synchronizes data inputs
+5V ±5%
ABSOLUTE MAXIMUM RATINGS
All Voltages referenced to GND, TA = Operating Temperature Range (unless otherwise specified)
PARAMETER
SYMBOL
CONDITIONS
OPERATING RANGE
Differential Voltage
VDIF
Voltage between +V and -V terminals
Supply Voltage
+V
-V
V1
+10.8 to +16.5
-10.8 to -16.5
+5 ±5%
Voltage Reference
VREF
For ARINC 429
For Applications other than ARINC
+5 ±5%
1.5 to 6
Input Voltage Range
VIN
Output Short-Circuit Duration
Output Overvoltage Protection
Operating Temperature Range
Storage Temperature Range
TA
TSTG
See Note: 1
See Note: 2
High-temp & Military
Industrial
Ceramic & Plastic
-55 to +125
-40 to +85
-65 to +150
MAXIMUM
40
+7
6
6
> GND -0.3
< V1 +0.3
UNIT
V
V
V
V
V
V
V
V
°C
°C
°C
Lead Temperature
Soldering, 10 seconds
+275
°C
Junction Temperature
TJ
+175
°C
Note 1. Heatsinking may be required for continuous Output Short Circuit operation at +125°C and for 100KBPS (high speed) data rate
operation at +125°C. Under either of these conditions the HI-318xPSx product with the Enhanced SOIC (ESOIC) package should
be selected (see Data Sheet for HI-3182PSx, HI-3184PSx and HI-3185PSx).
Note 2. The fuses used for Output Overvoltage Protection may be blown by the presence of a voltage at either output that is greater
than ±12.0V with respect to GND. (HI-3182PSx-N and HI-3184PSx-N only)
NOTE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings
only. Functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
HOLT INTEGRATED CIRCUITS
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