HA12181FP Datasheet, PDF (8/21 Pages) Hitachi Semiconductor – AM Radio Noise Reduction System

HA12181FP
Test Circuit
IF-IN
PULSE-IN
C501
1000p
50
R505 C504
47k 0.22µ
Det.Out
B
V_CC (8.2V)
+
A
C503 ⁺
0.01µ
R502
15k
R503 C507 C509
180k 2200p 0.033µ
C506
100µ
16
15
14
13
12
11
10
R504
4.7k
+
C508
1µ
9
C OUT
AM-SG
AF-IN
+
50
AF-SG
C513
1µ
R500
100k
1
2
3
4
5
6
+ _{C502 C500}
3.3µ 0.033µ
R506 C512 C511
12k 0.068µ 0.033µ
7
8
C510
0.033µ
Unit R : Ω
C:F
Note: 1. Resistors tolerance are within ±5%.
2. Capacitors tolerance (C509 to C512) are within ±5%, other capacitor are within ±10%.
Operation Principle
ANT.
A
1st IFT
16 _IF
Noise
Detector
B
RF
CONV.
IF
AM-IC
DET
3
C
Processing
Waveform Circuit
9 _Out
HA12181FP _D
Figure 2 System Block Diagram of AM Radio
Rev.2, Jun. 1997, page 8 of 21