HA17901 Datasheet, PDF (6/16 Pages) Hitachi Semiconductor – Quadruple Comparators

HA17901, HA17339 Series
Test Circuits
1. Input offset voltage (V_IO), input offset current (I_IO), and Input bias current (I_IB) test circuit
Rf 5k
R_S 50
R_S 50
V_C1
SW1
R 20 k
R 20 k
SW2
Rf 5 k
V_C2
V_CC
– ^{RL 51k}
V_O
+
470µ_{–+ V}
SW1
On
Off
On
Off
SW2
On
Off
Off
On
Vout
V_O1
V_O2
V_O3
V_O4
V_C1 =
1
2
V_CC
V_C2 = 1.4V
V_IO
=
1
| V_O1
+ Rf /
|
R_S
(mV)
I_IO =
| V_O2 – V_O1 |
R(1 + Rf / R_S)
(nA)
I_IB =
| V_O4 – V_O3 |
2 · R(1 + Rf / R_S)
(nA)
2. Output saturation voltage (V_O sat) output sink current (Iosink), and common-mode input voltage (V_CM)
test circuit
50
SW1 1
2
V_{C1 5k}
SW2
1
2
50
V_C2
V_CC
1.6k
−
+
50
4.87k
Item V_C1
V_Osat 2V
V_C3
SW3
Iosink 2V
V_CM 2V
V_C2 V_C3 SW1
0V — 1
0V 1.5V 1
–1 to — 2
V_CC
SW2 SW3
Unit
1
1 at
V
V_CC = 5V
3 at
V_CC = 15V
1
2
mA
Switched 3
V
between
1 and 2
3. Supply current (I_CC) test circuit
1V
A
+
–
V_CC
I_CC: R_L = ∞
6