HA17902 Datasheet, PDF (5/14 Pages) Hitachi Semiconductor – Quad Operational Amplifier

HA17902 Series
Test Circuits
1. Input offset voltage (V_IO), input offset current (I_IO), and Input bias current (I_IB) test circuit
Rf 5k
SW1
V_CC
R_S 50
–
R 10k
R_S 50 _{R 10k}
+
Rf 5k SW2
V_CM
Vout
V
SW1 SW2 V_O
On
Off
On
Off
V_O1
V_O2
V_CM =
1
2
V_CC
On Off V_O3
Off On V_O4
V_IO
=
1
V_O1
+ Rf /
R_S
I_IO =
V_O2 – V_O1
R(1 + Rf / R_S)
(mV)
(nA)
I_IB =
| V_O4 – V_O3 |
2 · R(1 + Rf / R_S)
(nA)
2. Common-mode rejection ratio (CMR) test circuit
CMR = 20 log ^{VIN · Rf} (dB)
V_O · R_S
Rf 5.0k
R_S 50
V_CC
–
+
R_S 50 Rf
Vin
5.0k
Vout
3. Supply current (I_CC) test circuit
A
V_CC
–
Vout
+
5