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CD4049UB Datasheet, PDF (7/10 Pages) Texas Instruments – CMOS HEX BUFFERS/CONVERTERS
CD4049UB, CD4050B
Test Circuits
VCC
INPUTS
VCC
VSS
IDD
VSS
FIGURE 13. QUIESCENT DEVICE CURRENT TEST CIRCUIT
INPUTS
VIH
VIL
VCC
VSS
OUTPUTS
+
DVM
-
NOTE: Test any one input with other inputs at VCC or VSS.
FIGURE 14. INPUT VOLTAGE TEST CIRCUIT
VCC
VSS
INPUTS
VCC
I
VSS
OUTPUTS
NOTE: Measure inputs sequentially, to both VCC and VSS connect
all unused inputs to either VCC or VSS.
FIGURE 15. INPUT CURRENT TEST CIRCUIT
CMOS 10V LEVEL TO DTL/TTL 5V LEVEL
VCC = 5V
10V = VIH
COS/MOS
IN
CD4049
OUTPUT
TO DTL/TTL
INPUTS
0 = VIL
VSS
5V = VOH
0 = VOL
In Terminal - 3, 5, 7, 9, 11, or 14
Out Terminal - 2, 4, 6, 10, 12 or 15
VCC Terminal - 1
VSS Terminal - 8
FIGURE 16. LOGIC LEVEL CONVERSION APPLICATION
500µF
CL
10kHz,
100kHz, 1MHz
VDD
0.1µF
I
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
CL INCLUDES FIXTURE CAPACITANCE
FIGURE 17. DYNAMIC POWER DISSIPATION TEST CIRCUITS
7