74HC158 Datasheet, PDF (4/6 Pages) NXP Semiconductors – Quad 2-input multiplexer; inverting

CD74HC157, CD74HCT157, CD74HC158, CD74HCT158
DC Electrical Specifications (Continued)
PARAMETER
HCT TYPES
SYMBOL
TEST
CONDITIONS
V_I (V) I_O (mA)
V_CC
(V)
25^oC
-40^oC TO 85^oC -55^oC TO 125^oC
MIN TYP MAX MIN MAX MIN MAX UNITS
High Level Input
Voltage
V_IH
-
-
4.5 to
2
-
-
2
-
2
-
V
5.5
Low Level Input
Voltage
V_IL
-
-
4.5 to
-
-
0.8
-
0.8
-
0.8
V
5.5
High Level Output
V_OH V_IH or V_IL -0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
-4
4.5
3.98
-
-
3.84
-
3.7
-
V
Low Level Output
Voltage
CMOS Loads
V_OL V_IH or V_IL 0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
Low Level Output
Voltage
TTL Loads
4
4.5
-
-
0.26
-
0.33
-
0.4
V
Input Leakage
Current
I_I
V_CC and
0
GND
5.5
-
±0.1
-
±1
-
±1
µA
Quiescent Device
Current
I_CC
V_CC or
0
GND
5.5
-
-
8
-
80
-
160
µA
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
∆I_CC
V_CC
-2.1
-
4.5 to
-
100 360
-
450
-
490
µA
5.5
NOTE: For dual-supply systems theoretical worst case (V_I = 2.4V, V_CC = 5.5V) specification is 1.8mA.
HCT Input Loading Table
UNIT LOADS
INPUT
HCT157
HCT158
I (All)
0.95
0.4
E
0.6
0.6
S
3
2.8
NOTE:
360µA
mUanxitaLto2a5d^{oiCs.∆ICC}
limit
specified
in
DC
Electrical
Table,
e.g.,
Switching Specifications Input t_r, t_f = 6ns
PARAMETER
TEST
SYMBOL CONDITIONS
V_CC
(V)
25^oC
-40^oC TO 85^oC -55^oC TO 125^oC
MIN TYP MAX MIN MAX MIN MAX UNITS
HC/HCT157 TYPES
Propagation Delay (Figure 1) t_PLH, t_PHL C_L = 50pF
Data to Output
2
-
- 125
-
155
-
190
ns
4.5
-
- 25
-
31
-
38
ns
HC157
HCT157
C_L =15pF
5
- 10 -
-
-
-
-
ns
- 12 -
-
-
-
-
ns
C_L = 50pF
6
-
- 21
-
26
-
32
ns
4