S9979_11 Datasheet, PDF (3/7 Pages) Hamamatsu Corporation – CCD area image sensor TDI operation / large active area CCD

CCD area image sensor S9979
s Electrical and optical characteristics (Ta=25 °C, unless otherwise noted)
Parameter
Symbol Remark
Min.
Typ.
Max.
Unit
Saturation output voltage
Vsat
-
Fw × Sv
-
V
Vertical
Full well capacity Horizontal
Fw
600
1200
-
600
1200
-
ke^-
Summing
CCD node sensitivity
Dark current (MPP mode)
Readout noise
Sv
*⁵
DS
*⁶
Nr
*⁷
600
0.45
-
-
1200
0.6
2
60
-
-
µV/e^-
8
ke^-/pixel/s
120
e^-rms
Dynamic range
Photo response non-uniformity
DR
*⁸
PRNU *⁹
5000
20000
-
-
±3
±10
%
Spectral response range
λ
-
400 to 1100
-
nm
Blemish
Point
White spots
defects *¹⁰ Black spots
Cluster defects
Column defects
-
*¹¹
*¹²
-
-
0
-
-
-
-
0
0
-
-
-
0
*5: VOD=15 V.
*6: Dark current doubles for every 5 to 7 °C.
*7: -40 °C, operating frequency is 2 MHz.
*8: Dynamic range = Full well capacity / Readout noise
*9: Measured at the half of the full well capacity
PRNU (%) = Noise / Signal × 100
Noise: Fixed pattern noise (peak to peak)
*10: White spots > 20 times of Max. dark signal (8 ke^-/pixel/s).
Black spots
Pixels whose sensitivity is lower than one-half of the average pixel output (Measured with uniform light producing one-half of
the saturation charge)
*11: 2 to 9 contiguous defective pixels.
*12: 10 or more contiguous defective pixels.
s Spectral response (without window)
(Typ. Ta=25 ˚C)
50
40
30
20
UV COAT
10
0
200 300 400 500 600 700 800 900 1000 1100 1200
WAVELENGTH (nm)
KMPDB0244EB
3