S9970 Datasheet, PDF (3/10 Pages) Hamamatsu Corporation – CCD area image sensor Low dark signal · low readout noise/front-illuminated FFT-CCD

CCD area image sensor S9970/S9971 series
s Electrical and optical characteristics (Ta=25 °C, unless otherwise noted)
Parameter
Symbol Remark
Min.
Typ.
Max.
Unit
Saturation output voltage
Vsat
-
-
Fw × Sv
-
V
Full well
capacity
Vertical
Horizontal
Fw
-
150
300
300
600
CCD node sensitivity
Sv
*⁵
-
3.5
-
-
ke-
-
µV/e-
Dark current
(MPP mode)
Readout noise
+25 °C
0 °C
DS
*⁶
-
-
Nr
*⁷
-
200
10
3000
150
e-/pixel/s
4
18
e-rms
Dynamic range
Line binning
Area scanning
-
*⁸
16666
8333
150000
75000
-
-
-
Spectral response range
λ
-
-
400 to 1100
-
nm
Photo response non-uniformity
PRNU
*⁹
-
-
±10
%
Point defects
*¹⁰
-
-
0
Blemish
Cluster defects
-
*¹¹
-
-
0
-
Column defects
*¹²
-
-
0
*5: VOD=20 V , Load resistance=22 kΩ
*6: Dark current nearly doubles for every 5 to 7 °C increase in temperature.
*7: -40 °C, operating frequency is 80 kHz.
*8: DR = Fw / Nr
*9: Measured at half of the full well capacity. PRNU = noise / signal × 100 [%], noise: fixed pattern noise (peak to peak)
*10: White spots > 3 % of full well at 0 °C after Ts=1 s
Black spots
Pixels whose sensitivity is lower than one-half of the average pixel output. (Measured with uniform light producing one-
half of the saturation charge)
*11: 2 to 9 contiguous defective pixels
*12: 10 or more contiguous defective pixels
s Spectral response (without window)
(Typ. Ta=25 ˚C)
50
40
30
20
UV COAT
10
0
200 300 400 500 600 700 800 900 1000 1100 1200
WAVELENGTH (nm)
KMPDB0244EB
s Spectral transmittance characteristics
(Typ. Ta=25 ˚C)
100
90
80
QUARTZ WINDOW
70
SAPPHIRE WINDOW
60
50
40
30
20
10
0
100 200 300 400 500 600 700 800 900 1000
WAVELENGTH (nm)
KMPDB0101EA
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