S11850-1106_15 Datasheet, PDF (1/10 Pages) Hamamatsu Corporation – CCD image sensors

CCD image sensors
S11850-1106 S11851-1106
Improved etaloning characteristics,
Constant element temperature control
The S11850/11851-1106 are back-thinned CCD image sensors designed for spectrometers. Two types consisting of a
low noise type (S11850-1106) and high-speed type (S11851-1106) are available with improved etaloning characteris-
tics. The S11850/11851-1106 offer nearly flat spectral response characteristics with high quantum efficiency from the
UV to near infrared region. A thermoelectric cooler is placed inside the package to keep the element temperature con-
stant (approx. 5 °C) during operation.
Features
Improved etaloning characteristics
One-stage TE-cooled type
(element temperature: approx. 5 °C)
High sensitivity over a wide spectral range and nearly
flat spectral response characteristics
High CCD node sensitivity: 6.5 μV/e- (S11850-1106)
8 μV/e- (S11851-1106)
High full well capacity, wide dynamic range
(with anti-blooming function)
Pixel size: 14 × 14 μm
Applications
Spectrometers, etc.
Improved etaloning characteristics
Etaloning is an interference phenomenon that occurs when the light
incident on a CCD repeatedly reflects between the front and back
surfaces of the CCD while being attenuated, and causes alternately
high and low sensitivity. When long-wavelength light enters a back-
thinned CCD, etaloning occurs due to the relationship between the
silicon substrate thickness and the absorption length. The back-
thinned CCDs (S11850/S11851-1106) have achieved a significant
improvement in etaloning by using a unique structure that is un-
likely to cause interference.
Etaloning characteristics (typical example)
(Ta=25 °C)
110
100
Etaloning-improved type
90
80
70
60
Previous type
50
40
30
20
10
0
900 910 920 930 940 950 960 970 980 990 1000
Wavelength (nm)
KMPDB0284EB
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