GS832036AGT-250I Datasheet, PDF (14/24 Pages) GSI Technology – 2M x 18, 1M x 32, 1M x 36 36Mb Sync Burst SRAMs

GS832018/32/36AGT-400/375/333/250/200/150
Capacitance
(T_A = 25^oC, f = 1 MHZ, V_DD = 2.5 V)
Parameter
Input Capacitance
Input/Output Capacitance
Note:
These parameters are sample tested.
Symbol
C_IN
C_I/O
Test conditions
V_IN = 0 V
V_OUT = 0 V
AC Test Conditions
Parameter
Input high level
Input low level
Input slew rate
Input reference level
Output reference level
Output load
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
Typ.
Max.
Unit
4
5
pF
6
7
pF
Conditions
V_DD – 0.2 V
0.2 V
1 V/ns
V_DD/2
V_DDQ/2
Fig. 1
Output Load 1
DQ
50
30pF^*
V_DDQ/2
* Distributed Test Jig Capacitance
Rev: 1.03 8/2013
14/23
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2011, GSI Technology