YG912S6R Datasheet, PDF (7/14 Pages) Fuji Electric – LOW LOSS SUPER HIGH SPEED RECTIFIER

Tentative
(Under developmemt)
Test
cate-
gories
Test items
1 High temperature
Reverse Bias
2 High temperature
Bias (for gate)
3 Temperature
Humidity Bias
4 Intermitted
Operating Life
(Power cycle)
( for IGBT )
Reliability Test Items
Test methods and conditions
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Relative humidity
Bias Voltage
Bias Method
Test duration
ON time
OFF time
Test temp.
Number of cycles
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: Ta = 125±5 ℃
(Tj ≦ 150 ℃)
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
VCE = 0V
: 1000hr.
: 85±2 ^oC
: 85±5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
VGE = 0V
: 1000hr.
: 2 sec.
: 18 sec.
: Tj=100±5 deg
Tj ≦ 150 ℃, Ta=25±5 ℃
: 15000 cycles
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of sample
Accept-
ance
number
Test Method 101
5
(0:1)
Test Method 101
5
(0:1)
Test Method 102
5
(0:1)
Condition code C
Test Method 106
5
(0:1)
Failure Criteria
Item
Characteristic
Electrical
characteristic
Visual
inspection
Leakage current
Gate threshold voltage
Saturation voltage
Forward voltage
Thermal
IGBT
resistance
FWD
Isolation voltage
Visual inspection
Peeling
Plating
and the others
Symbol
Failure criteria
Unit
Lower limit Upper limit
ICES
-
USL×2 mA
±IGES
-
USL×2
A
VGE(th) LSL×0.8 USL×1.2 mA
VCE(sat)
-
USL×1.2 V
VF
-
USL×1.2 V
VGE
-
USL×1.2 mV
or VCE
VF
-
USL×1.2 mV
Viso
Broken insulation
-
-
The visual sample
-
Note
LSL : Lower specified limit.
USL : Upper specified limit.
Note : Each parameter measurement read-outs shall be made after stabilizing the components at room
ambient for 2 hours minimum, 24 hours maximum after removal from the tests. And in case of the
wetting tests, for example, moisture resistance tests, each component shall be made wipe or dry
completely before the measurement.
MT5F16507
7 14
H04-004-003