MC9S08QE8_11 Datasheet, PDF (30/52 Pages) Freescale Semiconductor, Inc – Up to 20 MHz CPU at 3.6 V to 1.8 V across temperature range of –40 °C to 85 °C

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3.14.1 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
Table 19.
Parameter
Table 19. Conducted Susceptibility, EFT/B
Symbol
Conditions
f_OSC/f_BUS
Result
Amplitude¹
(Min)
Unit
A
2.3
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V_{CS_EFT}
V_DD = 3.3 V
T_A = 25 ^oC
package type
32-pin LQFP
8 MHz
crystal
8 MHz bus
B
C
D
4.0
kV
>4.0
>4.0
1 _{Data based on qualification test results. Not tested in production.}
The susceptibility performance classification is described in Table 20.
Table 20. Susceptibility Performance Classification
Result
A
No failure
Performance Criteria
The MCU performs as designed during and after exposure.
B
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
E
Damage
be returned to proper operation due to physical damage or other permanent
performance degradation.
4 Ordering Information
This section contains ordering information for the device numbering system.
Example of the device numbering system:
MC9S08QE8 Series Data Sheet, Rev. 8
30
Freescale Semiconductor