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MC9RS08KA8_08 Datasheet, PDF (23/42 Pages) Freescale Semiconductor, Inc – MCU Block Diagram | |||
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Electrical Characteristics
Table 15. 10-bit ADC Characteristics (continued)
Characteristic
Conditions
C Symb
Min Typical1 Max
Unit
Supply current
ADC asynchronous clock
source
Stop, reset, module off
T
IDDAD
â
High speed (ADLPC = 0)
â
Low power (ADLPC = 1)
T
fADACK
â
0.011
3.3
2
1
μA
â
MHz
â
Conversion time (including
sample time)
Short sample (ADLSMP=0)
P
Long sample (ADLSMP=1)
tADC
â
â
20
40
â
ADCK
â
cycles
Sample time
Short sample (ADLSMP=0)
â
P
tADS
Long sample (ADLSMP=1)
â
3.5
23.5
â
ADCK
â
cycles
Total unadjusted error
10 bit mode
8 bit mode
â
C
ETUE
â
±1
±2.5
LSB2
±0.5
±1.0
Differential non-linearity
10 bit mode
8 bit mode
P
â
DNL
T
â
±0.5
±1.0
LSB2
±0.3
±0.5
Monotonicity and No-Missing-Codes guaranteed
Integral non-linearity
10 bit mode
8 bit mode
â
±0.5
±1.0
C
INL
LSB2
â
±0.3
±0.5
Zero-scale error
10 bit mode
8 bit mode
P
â
±0.5
±1.5
EZS
LSB2
T
â
±0.5
±0.5
Full-Scale error
VADIN = VDDA
10 bit mode
8 bit mode
P
â
±0.5
±1.5
EFS
LSB2
T
â
±0.5
±0.5
Quantization error
10 bit mode
8 bit mode
â
D
EQ
â
â
±0.5
LSB2
â
±0.5
Input leakage error
pad leakage3 * RAS
10 bit mode
8 bit mode
â
±0.2
±2.5
D
EIL
LSB2
â
±0.1
±1
1 Typical values assume Temp = 25 °C, fADCK = 1.0 MHz unless otherwise stated. Typical values are for reference only and are
not tested in production.
2 1 LSB = (VREFH â VREFL)/2N
3 Based on input pad leakage current. Refer to pad electrical.
3.13 Flash Specifications
This section provides details about program/erase times and program-erase endurance for the flash
memory. For detailed information about program/erase operations, see the reference manual.
Table 16. Flash Characteristics
Characteristic
Supply voltage for program/erase
Symbol
VDD
Min
Typical1
Max
Unit
2.7
â
5.5
V
MC9RS08KA8 Series MCU Data Sheet, Rev. 2
Freescale Semiconductor
23
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