33879_09 Datasheet, PDF (12/23 Pages) Freescale Semiconductor, Inc – Configurable Octal Serial Switch with Open Load Detect Current Disable

ELECTRICAL CHARACTERISTICS
TYPICAL ELECTRICAL CHARACTERISTICS
SCLK
V_DD = 5.0 V
33879
Under
Test
DO
C_L = 200 pF
NOTE: C_L represents the total capacitance of the test
fixture and probe.
Figure 5. Valid Data Delay Time
and Valid Time Test Circuit
SCLK
t_R(DI)
0.7 V_DD
< 50 ns ^tF(DI
50%
< 50 ns
3.3/5.0 V
0.2 V_DD
0V
0.7 V_DD
V_OH
DO
0.2 V_DD
(Low-to-High)
DO
(High-to-Low) 0.7 V_DD
t_R(DO
t_VALID
V_OL
V_OH
0.2
V_OL
Figure 6. Valid Data Delay Time
and Valid Time Waveforms
t_F(CS)
t_R(CS)
< 50 ns
CS
0.2 V_DD
DO
(Tri-State to Low)
90%
10%
t_DO(EN)
90%
< 50 ns
3.3/5.0 V
0.7 V_DD
0V
t_DO(DIS)
V_Tri-State
10% _VOL
t_DO(EN)
90%
t_DO(DIS)
V_OH
DO
(Tri-State to High)
10%
V_Tri-State
Figure 7. Enable and Disable Time Waveforms
TYPICAL ELECTRICAL CHARACTERISTICS
20
V_PWR @ 18 V
19
18
17
16
15
14
33879
33879A
-40 -25 0 25 50 75 100 125
T_A, Ambient Temperature (°C)
Figure 8. I_PWR vs. Temperature
7
V_PWR @ 13 V
6
5
4
3
2
1
-40 -25 0 25 50 75 100 125
T_A, Ambient Temperature (°C)
Figure 9. Sleep State I_PWR vs. Temperature
33879
12
Analog Integrated Circuit Device Data
Freescale Semiconductor