FXTC-HE73 Datasheet, PDF (5/11 Pages) Fox Electronics – 7 x 5mm 3.3V TCXO

An Integrated Device Technology, Inc. Company
Model: FXTC-HE73 Series
Preliminary
Phase Noise
Phase Noise was measured on an Agilent 5052A Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 3.3V.
15.36MHz only to 5MHz offset due to Equipment Limitation.
Jitter is frequency dependent. Below are typical measured values at select frequencies.
Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
12kHz to 20MHz (Fo = 156.16 MHz)
12kHz to 5MHz (Fo = 15.36 MHz)
TIE
(Sigma of Jitter Distribution)
Units
15.36 MHz
0.94
3.5
pS RMS
156.16 MHz
1.10
3.9
pS RMS
Phase Jitter is integrated from Agilent 5052A Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 3.3V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V_DD = 3.3V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Random & Deterministic Jitter Composition
Random (Rj) Deterministic (Dj)
Frequency
(pS RMS)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
15.36 MHz
1.68
8.7
32.7
156.16 MHz
1.47
10.3
31.3
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Doc #100909
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