FXO-LC53 Datasheet, PDF (5/15 Pages) Fox Electronics – LVDS 5 x 3.2mm 3.3V Oscillator

FXO-LC53 Series
Phase Noise
0 dBc
-10dBc
-20dBc
-30dBc
-40dBc
-50dBc
212.5 MHz
-60dBc
622.08 MHz
-70dBc
-80dBc
-90dBc
62.5 MHz
-100dBc
-110dBc
-120dBc
-130dBc
-140dBc
-150dBc
-160dBc
10
100
Phase Noise Graph
(dBc / Hz) vs. offset frequency
FOUR frequencies matching
the below jitter measurements
Data Collected using HP 3048A
156.25MHz
62.5 MHz
1k
10k
100k
1M
Offset Frequency (10Hz to 40MHz)
622.08 MHz
156.25MHz
212.5 MHz
10M 40M
Jitter is frequency dependent. Below are typical values at select frequencies.
LVDS Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
TIE
(Sigma of Jitter Distribution)
Units
62.5 MHz
0.77
3.0
pS RMS
156.25 MHz
1.19
3.6
pS RMS
212.5 MHz
0.89
622.08MHz
0.99
3.9
pS RMS
3.2
pS RMS
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 3.3V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V_DD = 3.3V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
LVDS Random & Deterministic Jitter Composition
Random (Rj) Deterministic (Dj)
Frequency
(pS RMS)
(pS P-P)
Total Jitter (Tj)
(14 x Rj) + Dj
62.5 MHz
1.3
7.0
24.9 pS
156.25 MHz
1.3
5.8
23.6 pS
212.5 MHz
0.9
6.7
622.08 MHz
1.1
5.3
18.7 pS
20.7 pS
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
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