FXO-LC32 Datasheet, PDF (5/16 Pages) Fox Electronics – LVDS 3.2 x 2.5mm 2.5V Oscillator

FXO-LC32 Series
Phase Noise
0
2.5V Phase Noise Graphs
-20
(dBc/Hz vs. offset frequency
-40
622.08M Hz
212.5M Hz
-60
Data Collected using HP 3048A
Four Frequencies f rom Jitter Tables
62.5MHz only to 2MHz offset due to Equipment Limitation
-80
-100
-120
-140
156.25M Hz
62.5M Hz
-160
10
100
1000
10000
100000
1000000
10000000 100000000
Jitter is frequency dependent. Below are typical values at select frequencies.
LVDS Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
TIE
(Sigma of Jitter Distribution)
Units
62.5 MHz
0.9
2.9
pS RMS
156.25 MHz
1.1
3.5
pS RMS
212.5 MHz
1.2
622.08MHz
0.8
3.9
pS RMS
2.4
pS RMS
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 2.5V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V_DD = 2.5V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
LVDS Random & Deterministic Jitter Composition
Frequency
62.5 MHz
156.25 MHz
212.5 MHz
622.08 MHz
Random (Rj)
(pS RMS)
1.3
1.4
1.4
1.0
Deterministic (Dj)
(pS P-P)
9.6
9.8
11.4
13.05
Total Jitter (Tj)
(14 x Rj) + Dj
28.6 pS
29.4pS
30.9 pS
27.5 pS
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
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