FXO-HC52 Datasheet, PDF (5/15 Pages) Fox Electronics – HCMOS 5 x 3.2mm 2.5V Oscillator

FXO-HC52 Series
Phase Noise
0 dBc
-10dBc
-20dBc
-30dBc
-40dBc
-50dBc
-60dBc
-70dBc
-80dBc
-90dBc
156.25MHz
125MHz
2.5V Phase Noise Graphs
(dBc / Hz) vs. offset frequency
Data Collected using HP 3048A
Four Frequencies from Jitter Tables
62.5 MHz only to 2 MHz offset Equipment Limitation
-100dBc
-110dBc
62.5 MHz
-120dBc
-130dBc
-140dBc
62.5 MHz
156.25MHz
-150dBc
-160dBc
10
100
1k
10k
100k
1M
Offset Frequency (10Hz to 40MHz)
106.25 MHz
125MHz
10M 40M
Jitter is frequency dependent. Below are typical values at select frequencies.
Phase Jitter & Time Interval Error (TIE)
Frequency
Phase Jitter
(12kHz to 20MHz)
TIE
(Sigma of Jitter Distribution)
Units
62.5 MHz
2.1
3.1
pS RMS
106.25 MHz
1.2
3.5
pS RMS
125 MHz
1.1
156.25 MHz
0.8
2.7
pS RMS
3.7
pS RMS
Phase Jitter is integrated from HP3048 Phase Noise Measurement System; measured directly into 50 ohm input; V_DD = 2.5V.
TIE was measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software; V_DD = 2.5V.
Per MJSQ spec (Methodologies for Jitter and Signal Quality specifications)
Random & Deterministic Jitter Composition
Frequency
62.5 MHz
106.25 MHz
125 MHz
156.25 MHz
Random (Rj)
(pS RMS)
1.3
1.4
1.3
1.4
Deterministic (Dj)
(pS P-P)
8.4
8.3
6.7
9.7
Total Jitter (Tj)
(14 x Rj) + Dj
27.6 pS
27.7 pS
25.6 pS
29.5 pS
Rj and Dj, measured on LeCroy LC684 Digital Storage Scope, directly into 50 ohm input, with Amherst M1 software.Per MJSQ spec
(Methodologies for Jitter and Signal Quality specifications)
Page 5 of 15
© 2008 FOX ELECTRONICS | ISO9001:2000 Certified