English
Language : 

10091799-101LF Datasheet, PDF (1/18 Pages) FCI connector – Report EL-2011-04-020A CR-PE
Electronics Division
FCI USA LLC
Report EL-2011-04-020A CR-PE
Intermateability Testing, ATCS and FCI XCede® Connectors
(XCede® is a registered trademark of the Amphenol Corp.)
01 May 2011
PURPOSE
ATCS and FCI XCede® connectors were subjected to intermateability testing. Tested product included ATCS gold plated receptacles
and headers, FCI GXT™ plated receptacles and headers, and FCI gold plated headers.
CONCLUSIONS
The tested samples met the specified requirements.
SAMPLE DESCRIPTION
The test samples were composed of 4-pair connector modules. Each connector module was constructed of six (6) wafers, each wafer
having 4 pairs of signal contacts. The header modules were in a vertical configuration; the receptacle modules were in a right angle
configuration. The contact surfaces of the header terminals were lubricated. The details of the submitted test samples are given in the
following table.
SUBMITTED SAMPLE DESCRIPTION
Item
Description
Part #
Plating Type (µm)
1
FCI XCede® Receptacle Module
2 FCI XCede® Receptacle Monoblock1
10091799-101LF
10091960-400LF
GXT™ (0.76) / Ni (2.54)
GXT™ (0.76) / Ni (2.54)
3
FCI XCede® Header Module
10091767-00C-20DLF GXT™ (0.76) / Ni (2.54)
4
FCI XCede® Header Module
10091767-00C-20DLF Au (0.76) / Ni (2.54)
5
ATCS XCede® Receptacle Module
950-400A-B1D
Au (0.76) / Ni (1.27)
6 ATCS XCede® Receptacle Monoblock1
AX400-00566
Au (0.76) / Ni (1.27)
7
ATCS XCede® Header Module
951400C20D
Au (0.76) / Ni (1.27)
8
ATCS XCede® Test Board
PCB444 Rev E
Immersion Sn
1 Each receptacle monoblock consisted of 3 receptacle modules with a common organizer.
Each backplane test board held three (3) header modules; each daughter card test board held a single 3-module monoblock receptacle
assembly. The test boards provided circuitry for low level contact resistance (LLCR) measurement of 120 positions per sample
comprising 60 signal contacts, 51 wide ground contacts, and 9 narrow (end) ground contacts. Dielectric testing was conducted on
single unmounted modules
The connectors were tested in all inter-mated combinations of ATCS and FCI receptacles with ATCS, FCI GXT™ plated, and FCI
gold plated headers. The resulting sample sets are listed in the following table.
EL-2011-04-020A CR-PE
1. This Engineering Test Report shall not be reproduced except in full unless written permission is received from the V.P. Engineering.
Page 1 of 18