74ABT899 Datasheet, PDF (9/16 Pages) NXP Semiconductors – 9-bit dual latch transceiver with 8-bit parity generator/checker 3-State

Skew
(PLCC package) (Note 2)
T_A = −40°C to +85°C
T_A = −40°C to +85°C
V_CC = 4.5V–5.5V
V_CC = 4.5V–5.5V
Symbol
Parameter
C_L = 50 pF
9 Outputs Switching
C_L = 250 pF
9 Outputs Switching
Units
(Note 19)
(Note 20)
Max
Max
t_OSHL
(Note 21)
Pin to Pin Skew
HL Transitions
1.0
2.0
ns
t_OSLH
(Note 21)
Pin to Pin Skew
LH Transitions
1.1
2.1
ns
t_PS
(Note 22)
Duty Cycle
LH–HL Skew
2.0
3.5
ns
t_OST
(Note 21)
Pin to Pin Skew
LH/HL Transitions
2.0
3.5
ns
t_PV
(Note 23)
Device to Device Skew
LH/HL Transitions
3.0
4.0
ns
Note 19: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-to-
HIGH, HIGH-to-LOW, etc.).
Note 20: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load
capacitors in the standard AC load.
Note 21: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device.
The specification applies to any outputs switching HIGH to LOW (t_OSHL), LOW to HIGH (t_OSLH), or any combination switching LOW to HIGH and/or HIGH to
LOW (t_OST). This specification is guaranteed but not tested. Skew applies to propagation delays individually; i.e., A_n to B_n separate from LEA to A_n.
Note 22: This describes the difference between the delay of the LOW-to-HIGH and the HIGH-to-LOW transition on the same pin. It is measured across all
the outputs (drivers) on the same chip, the worst (largest delta) number is the guaranteed specification. This specification is guaranteed but not tested.
Note 23: Propagation delay variation for a given set of conditions (i.e., temperature and V_CC) from device to device. This specification is guaranteed but not
tested.
Capacitance
Symbol
Parameter
Typ
C_IN
Input Pin Capacitance
C_I/O (Note 24)
Output Capacitance
Note 24: C_I/O is measured at frequency, f = 1 MHz, per MIL-STD-883B, Method 3012.
5.0
11.0
Units
pF
pF
Conditions
T_A = 25°C
V_CC = 0V
V_CC = 5.0V
9
www.fairchildsemi.com