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FSUSB30_07 Datasheet, PDF (7/20 Pages) Fairchild Semiconductor – Low-Power 2-Port Hi-Speed USB 2.0 (480Mbps) Switch
Test Diagrams
VON
FSUSB30
HSDn
Dn
VIN
GND
Select
VS = 0 to VCC
RON = VON / ION
ION
GND
Figure 4. On Resistance
FSUSB30
NC
IDn(OFF)
A
Select
VS = 0 or VCC
VIN
GND
Each switch port is tested separately.
Figure 5. Off Leakage
GND
HSDn
VIN
RS
FSUSB30
D+, D–
CL
RL VOUT
GND
VSel
GND
RL, RS, and CL are functions of the application environment
(see AC Electrical tables for specific values).
CL includes test fixture and stray capacitance.
tRISE = 500ps
800mV
Input: HSDn+,
HSDn–
400mV
10%
VOH
Output: D+, D–
VOL
90%
50%
90%
50%
50%
tPLH
tFALL = 500ps
10%
50%
tPHL
Figure 6. AC Test Circuit Load
Figure 7. Switch Propagation Delay Waveforms
tRISE = 2.5ns
VCC
Input – S, OE
GND
10%
90%
VCC/2
tFALL = 2.5ns
90%
VCC/2
10%
VOH
Output – VOUT
VOL
90%
tON
90%
tOFF
Figure 8. Turn-On / Turn-Off Waveform
© 2006 Fairchild Semiconductor Corporation
FSUSB30 Rev. 1.1.5
7
www.fairchildsemi.com