FOD050L_09 Datasheet, PDF (7/13 Pages) Fairchild Semiconductor – FOD050L, FOD250L: Single Channel FOD053L: Dual Channel LVTTL/LVCMOS 3.3V High Speed Transistor Optocouplers

Test Circuits
Pulse
Generator
tr = 5ns
I_F
Z_O = 50 Ω
10% D.C.
I/f < 100µs
Noise
Shield
1
+
2
V_F
-
3
I_F Monitor
R_m
4
8 ^VCC
7 ^VB
+3.3 V
Pulse
Generator
IF ⁺
tr = 5ns
1
Z_O = 50 Ω
VF1
R_L
10% DUTY CYCLE ^- ₂
I/f < 100µS
6 ^VO
0.1 µF
5
GND
V_O
CL = 1.5 pF
IF
MONITOR
R_m
-₃
VF2
+
4
Noise
Shield
VCC
8
RL
V01
7
V02
6
+3.3 V
VO
CL = 1.5 pF
GND
5
0.1 µF
Test Circuit for FOD050L and FOD250L
Test Circuit for FOD053L
I_F
0
VO
50%
T_PHL
3.3 V
50%
V_OL
T_PLH
Fig. 10 Switching Time Test Circuit
I_F
A
B
V_FF
Noise
Shield
1
+
2
V_F
-
3
4
8 ^VCC
+3.3 V
7 ^VB
R_L
6 ^VO
GND
5
VO
0.1 µF
-
+
V_-CM
Pulse Gen
Test Circuit for FOD050L and FOD250L
I_F
A
B
V_FF
+₁
VF1
-₂
Noise
Shield
-₃
VF2
+
4
VCC
8
RL
V01
7
+3.3 V
VO
V02
6
0.1 µF
GND
5
V_CM
+
-
Pulse Gen
Test Circuit for FOD053L
V_CM 1000 V
10 %
0V
t_r
90% 90%
10 %
t_f
VO
Switch at A : I_F = 0 mA
VO
Switch at A : I_F = 16 mA
3.3 V
VOL
Fig. 11 Common Mode Immunity Test Circuit
©2003 Fairchild Semiconductor Corporation
FOD050L, FOD250L, FOD053L Rev. 1.0.3
7
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