FAN3229_10 Datasheet, PDF (6/25 Pages) Fairchild Semiconductor – Dual 2A High-Speed, Low-Side Gate Drivers

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Min.
Max. Unit
VDD
VEN
VIN
VOUT
TL
TJ
TSTG
ESD
VDD to PGND
-0.3
20.0
V
ENA and ENB to GND
GND - 0.3 VDD + 0.3 V
INA, INA+, INA–, INB, INB+ and INB– to GND
GND - 0.3 VDD + 0.3 V
OUTA and OUTB to GND
GND - 0.3 VDD + 0.3 V
Lead Soldering Temperature (10 Seconds)
+260 ºC
Junction Temperature
-55
+150 ºC
Storage Temperature
-65
+150 ºC
Electrostatic Discharge ^{Human Body Model, JEDEC JESD22-A114}
4
kV
Protection Level
Charged Device Model, JEDEC JESD22-C101
1
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
VDD Supply Voltage Range
VEN Enable Voltage ENA and ENB
VIN Input Voltage INA, INA+, INA–, INB, INB+ and INB–
TA Operating Ambient Temperature
Min.
4.5
0
0
-40
Max.
18.0
VDD
VDD
+125
Unit
V
V
V
ºC
© 2007 Fairchild Semiconductor Corporation
FAN3226 / FAN3227 / FAN3228 / FAN3229 • Rev. 1.0.6
6
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