FQU2N60CTU Datasheet, PDF (5/9 Pages) Fairchild Semiconductor – Low Gate Charge (Typ. 8.5 nC)

Gate Charge Test Circuit & Waveform
Same Type
V_GS
50KΩ
as DUT
12V
200nF
300nF
10V
Q_g
V_GS
V_DS
Q_gs
Q_gd
DUT
3mA
Charge
10V
Resistive Switching Test Circuit & Waveforms
V_DS
V_GS
R_G
R_L
V_DD
DUT
V_DS
90%
V_GS ^10%
t_d(on)
t_r
t _on
t_d(off)
t_f
t _off
10V
t_p
Unclamped Inductive Switching Test Circuit & Waveforms
V_DS
I_D
R_G
L
E_AS = --21-- L I_AS2
------B--V--^D--^S-^S-------
BV_DSS - V_DD
BV_DSS
I_AS
V_DD
I_D (t)
DUT
V_DD
V_DS (t)
t_p
Time
©2009 Fairchild Semiconductor Corporation
FQD2N60C / FQU2N60C Rev. C0
5
www.fairchildsemi.com